On the temperature dependent forward bias current-voltage (I-V) characteristics in Au/2% graphene-cobalt doped (Ca3Co4Ga0.001Ox)/n-Si structure

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dc.authoridKocyigit, Serhat/0000-0003-0172-6180;
dc.contributor.authorMaril, E.
dc.contributor.authorKaya, A.
dc.contributor.authorCetinkaya, H. G.
dc.contributor.authorKocyigit, S.
dc.contributor.authorAltindal, S.
dc.date.accessioned2025-10-24T18:09:07Z
dc.date.available2025-10-24T18:09:07Z
dc.date.issued2015
dc.departmentMalatya Turgut Özal Üniversitesi
dc.description.abstractIn order to good interpret of temperature dependent main electrical parameters in Au/2% graphene-cobalt (GC) doped (Ca3Co4Ga0.001Ox)/n-Si structure, forward bias current-voltage (I-V) characteristics have been investigated in the temperature range of 80340 K. The possible current-conduction mechanisms (CCMs) in this structure was also investigate in detail. The ideality factor (n), reverse saturation current (I-o), and zero-bias barrier height (Phi(Bo)) values were found as 14.5, 7.2 x 10(-6) A, 0.141 eV at 80K and 3.18, 1.7 x 10(-3) A, and 0.526 eV at 340 K, respectively. It is clear that both the value of n and Phi(Bo) are strong function of temperature. While the value of n decreases with increasing temperature, Phi(Bo) increases. In order to explain such behavior of BH the Phi(Bo) and n, Phi(Bo) vs q/2kT, Phi(Bo) vs n, and (n(-1)-1) vs q/2kT plots were drawn to obtain an evidence of a Gaussian distribution (GD) of the BHs and it shows a straight line. The mean value of BH ((Phi) over bar (Bo)) and standard deviation (sigma(s)) were found from the slope and intercept of this plot as 0.614 eV and 0.088 V, respectively. By using the modified Richardson plot, the (Phi) over bar (Bo) and Richardson constant (A*) values were obtained from the slope and intercept of this plot as 0.604 eV and 108.23 A cm(-2) K-2, respectively. It is clear that this value of A* ( = 108.23 A cm(-2) K-2) is very close to the theoretical value 112 A cm(-2) K-2 for n-Si. In conclusion, the temperature dependence of the forward bias I-V characteristics of the structure can be successfully explained on the basis of a thermionic emission (TE) mechanism with GD of the BHs. (C) 2015 Elsevier Ltd. All rights reserved.
dc.identifier.doi10.1016/j.mssp.2015.05.029
dc.identifier.endpage338
dc.identifier.issn1369-8001
dc.identifier.issn1873-4081
dc.identifier.scopus2-s2.0-84930644490
dc.identifier.scopusqualityQ1
dc.identifier.startpage332
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2015.05.029
dc.identifier.urihttps://hdl.handle.net/20.500.12899/3475
dc.identifier.volume39
dc.identifier.wosWOS:000361774100046
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Sci Ltd
dc.relation.ispartofMaterials Science In Semiconductor Processing
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_20251023
dc.subjectAu/2% graphene-cobalt doped; (Ca3Co4Ga0.001Ox)/n-Si structure; Barrier inhomogeneity; Temperature dependent; Gaussian distribution (GD)
dc.titleOn the temperature dependent forward bias current-voltage (I-V) characteristics in Au/2% graphene-cobalt doped (Ca3Co4Ga0.001Ox)/n-Si structure
dc.typeArticle

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