Facile fabrication and characterization of SnxCu(1-x)O composite films by the SILAR method on glass substrates

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dc.authoridSahin, Bunyamin/0000-0001-7059-0315|Bayansal, Fatih/0000-0001-9600-007X
dc.contributor.authorBayansal, F.
dc.contributor.authorYuksel, M.
dc.contributor.authorSahin, B.
dc.date.accessioned2025-10-24T18:09:04Z
dc.date.available2025-10-24T18:09:04Z
dc.date.issued2016
dc.departmentMalatya Turgut Özal Üniversitesi
dc.description.abstractCuO composite thin films with Sn-doping are deposited on glass substrates by the SILAR method. All the films are characterized by metallurgical microscopy, scanning electron microscopy, energy dispersive Xray spectroscopy, X-ray diffraction, UV-Vis. spectroscopy and Raman spectroscopy. Metallurgical microscopy and scanning electron microscopy results revealed that homogeneity of the film surface distorts and particle size decreases from 110 to 43 nm with increasing Sn-doping. Energy dispersive X-ray spectroscopy evidences the amount of Sn in CuO films, which increases with increasing Sn concentration in the growth solutions. X-ray diffraction patterns showed that the mean crystallite size of the films is decreasing from similar to 14 to similar to 9 nm with increasing Sn-doping. Moreover, increase in Sn concentration results new peaks belong to SnO2 phases. UV-Vis. analysis showed that the transmittance and optical band-gap energy values of the films are increasing with increasing Sn-doping. Raman spectrum was also confirmed the phase formation of CuO nanostructures and it was seen that the Sn-doping caused shifts in Raman active modes. (c) 2015 Elsevier B.V. All rights reserved.
dc.description.sponsorshipScientific Research Commission of Mustafa Kemal University [12662]
dc.description.sponsorshipThe authors gratefully acknowledge the financial support of the Scientific Research Commission of Mustafa Kemal University (Project No: 12662). The authors are also grateful to Dr. Osman Sahin from Mustafa Kemal University, Faculty of Arts and Sciences, Department of Physics for technical assistance in the metallurgical microscope investigations.
dc.identifier.doi10.1016/j.jallcom.2015.12.174
dc.identifier.endpage44
dc.identifier.issn0925-8388
dc.identifier.issn1873-4669
dc.identifier.scopus2-s2.0-84952895372
dc.identifier.scopusqualityQ1
dc.identifier.startpage38
dc.identifier.urihttps://doi.org/10.1016/j.jallcom.2015.12.174
dc.identifier.urihttps://hdl.handle.net/20.500.12899/3452
dc.identifier.volume664
dc.identifier.wosWOS:000369061700006
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Sa
dc.relation.ispartofJournal Of Alloys And Compounds
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_20251023
dc.subjectComposite materials; Metal oxides; Nanostructured thin films; Raman spectroscopy; CuO; Sn-doping
dc.titleFacile fabrication and characterization of SnxCu(1-x)O composite films by the SILAR method on glass substrates
dc.typeArticle

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