Shi, YangZhao, XiangmoGuan, XiaohongTian, DaxinHuang, PanfengMao, GuoqiangMu, Kenan2026-06-192026-06-192025979-833153943-6https://doi.org/10.1109/IFEEA66847.2025.11387892https://hdl.handle.net/20.500.12899/488512th International Forum on Electrical Engineering and Automation, IFEEA 2025 -- 7 November 2025 through 9 November 2025 -- Xi�an -- 220504[Abstract Not Available]eninfo:eu-repo/semantics/closedAccess[Keyword Not Available]Editorial10.1109/IFEEA66847.2025.11387892iiii2-s2.0-105035075022N/A